Uniqueness of parameter estimates obtained from fitting free carrier absorption data of silicon wafers
In this paper, a data processing method is employed to improve the uniqueness of the electronic transport parameters (the carrier lifetime, carrier diffusion coefficient, and front and rear surface recombination velocities) obtained from fitting free carrier absorption data of silicon wafers. By emp...
| Main Authors: | , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2021-10-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/5.0059258 |