Uniqueness of parameter estimates obtained from fitting free carrier absorption data of silicon wafers
In this paper, a data processing method is employed to improve the uniqueness of the electronic transport parameters (the carrier lifetime, carrier diffusion coefficient, and front and rear surface recombination velocities) obtained from fitting free carrier absorption data of silicon wafers. By emp...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2021-10-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/5.0059258 |
| _version_ | 1818893785504940032 |
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| author | Qian Wang Chenyang Wei Lei Gong Liguo Wang Yaqing Li Linqiu Tan Wei Wang |
| author_facet | Qian Wang Chenyang Wei Lei Gong Liguo Wang Yaqing Li Linqiu Tan Wei Wang |
| author_sort | Qian Wang |
| collection | DOAJ |
| description | In this paper, a data processing method is employed to improve the uniqueness of the electronic transport parameters (the carrier lifetime, carrier diffusion coefficient, and front and rear surface recombination velocities) obtained from fitting free carrier absorption data of silicon wafers. By employing the mean square variance graph or map, the influence of initial values on multi-parameter estimation greatly decreases. Theoretical simulations are performed to investigate the dependence of the uniqueness of the estimated parameters on the number of free parameters by choosing different initial values during multi-parameter fitting. Simulation and experimental results show that the proposed method can significantly improve the uniqueness of the fitted electronic transport parameters. |
| first_indexed | 2024-12-19T18:18:07Z |
| format | Article |
| id | doaj.art-d9e6ac710cfe4f798fba2273cd653543 |
| institution | Directory Open Access Journal |
| issn | 2158-3226 |
| language | English |
| last_indexed | 2024-12-19T18:18:07Z |
| publishDate | 2021-10-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | AIP Advances |
| spelling | doaj.art-d9e6ac710cfe4f798fba2273cd6535432022-12-21T20:11:03ZengAIP Publishing LLCAIP Advances2158-32262021-10-011110105003105003-810.1063/5.0059258Uniqueness of parameter estimates obtained from fitting free carrier absorption data of silicon wafersQian Wang0Chenyang Wei1Lei Gong2Liguo Wang3Yaqing Li4Linqiu Tan5Wei Wang6School of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, ChinaSchool of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, ChinaSchool of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, ChinaSchool of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, ChinaSchool of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, ChinaSchool of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, ChinaSchool of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, ChinaIn this paper, a data processing method is employed to improve the uniqueness of the electronic transport parameters (the carrier lifetime, carrier diffusion coefficient, and front and rear surface recombination velocities) obtained from fitting free carrier absorption data of silicon wafers. By employing the mean square variance graph or map, the influence of initial values on multi-parameter estimation greatly decreases. Theoretical simulations are performed to investigate the dependence of the uniqueness of the estimated parameters on the number of free parameters by choosing different initial values during multi-parameter fitting. Simulation and experimental results show that the proposed method can significantly improve the uniqueness of the fitted electronic transport parameters.http://dx.doi.org/10.1063/5.0059258 |
| spellingShingle | Qian Wang Chenyang Wei Lei Gong Liguo Wang Yaqing Li Linqiu Tan Wei Wang Uniqueness of parameter estimates obtained from fitting free carrier absorption data of silicon wafers AIP Advances |
| title | Uniqueness of parameter estimates obtained from fitting free carrier absorption data of silicon wafers |
| title_full | Uniqueness of parameter estimates obtained from fitting free carrier absorption data of silicon wafers |
| title_fullStr | Uniqueness of parameter estimates obtained from fitting free carrier absorption data of silicon wafers |
| title_full_unstemmed | Uniqueness of parameter estimates obtained from fitting free carrier absorption data of silicon wafers |
| title_short | Uniqueness of parameter estimates obtained from fitting free carrier absorption data of silicon wafers |
| title_sort | uniqueness of parameter estimates obtained from fitting free carrier absorption data of silicon wafers |
| url | http://dx.doi.org/10.1063/5.0059258 |
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