SEU Tolerance Efficiency of Multiple Layout-Hardened 28 nm DICE D Flip-Flops

SEU Tolerance Efficiency of Multiple Layout-Hardened 28 nm DICE D Flip-Flops

Three layout-hardened Dual Interlocked Storage Cell (DICE) D Flip-Flops (DFFs) were designed and manufactured based on an advanced 28 nm planar technology. The systematic vertical and tilt heavy ion irradiations demonstrated that the DICE structure contributes to radiation tolerance. However, it is...

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Bibliographic Details
Main Authors: Yaqing Chi, Chang Cai, Ze He, Zhenyu Wu, Yahao Fang, Jianjun Chen, Bin Liang
Format: Article
Language:English
Published: MDPI AG 2022-03-01
Series:Electronics
Subjects:
D Flip-Flop
heavy ion
radiation hardened
Single Event Upset
Online Access:https://www.mdpi.com/2079-9292/11/7/972

Internet

https://www.mdpi.com/2079-9292/11/7/972

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