Microfocus X-Ray Computed Tomography (CT) Analysis Of Laser Sintered Parts
Microfocus X-ray computed tomography (CT) scanning is a three-dimensional (3D) non-destructive technique that is useful in many research and technology fields. Similar to two-dimensional (2D) X-ray inspections, this 3D technology allows the investigation of almost any material down to 1 micron spati...
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| Format: | Article |
| Language: | English |
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Stellenbosch University
2014-05-01
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| Series: | South African Journal of Industrial Engineering |
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| Online Access: | http://sajie.journals.ac.za/pub/article/view/663 |