Accuracy of AFM force distance curves via direct solution of the Euler-Bernoulli equation

In an effort to improve the accuracy of force-separation curves obtained from atomic force microscope data, we compare force-separation curves computed using two methods to solve the Euler-Bernoulli equation. A recently introduced method using a direct sequential forward solution, Causal Time-Domain...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Steven J. Eppell, Yehe Liu, Fredy R. Zypman
Μορφή: Άρθρο
Γλώσσα:English
Έκδοση: AIP Publishing LLC 2016-03-01
Σειρά:AIP Advances
Διαθέσιμο Online:http://dx.doi.org/10.1063/1.4945409