On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures
We describe a system for performing on-wafer vector-network-analyzer measurements from 100 MHz to 15 GHz at mK temperatures (<italic>i.e.</italic>, less than 20 mK). We first demonstrate a camera-less probe positioning system and calibrate this system at 4.4 K. We then use this positioni...
| Main Authors: | , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2023-01-01
|
| Series: | IEEE Journal of Microwaves |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10015198/ |