Features of the model of main information failures in digital CMOS VLSI at impact of the radiation
The methods of information security, which are based on the use of functional-logical modeling of very large digital integrated circuits (VLSI) under the influence of ionizing radiation are considered. It is shown that the multiplicity of the node and the power of the spectrum are more accurately de...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Joint Stock Company "Experimental Scientific and Production Association SPELS
2018-03-01
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| Series: | Безопасность информационных технологий |
| Subjects: | |
| Online Access: | https://bit.mephi.ru/index.php/bit/article/view/1091 |