Barbashov, V. M., & Trushkin, N. S. (2018). Features of the model of main information failures in digital CMOS VLSI at impact of the radiation. Joint Stock Company "Experimental Scientific and Production Association SPELS.
Chicago Style (17th ed.) CitationBarbashov, Vyacheslav M., and Nikolai S. Trushkin. Features of the Model of Main Information Failures in Digital CMOS VLSI at Impact of the Radiation. Joint Stock Company "Experimental Scientific and Production Association SPELS, 2018.
MLA (9th ed.) CitationBarbashov, Vyacheslav M., and Nikolai S. Trushkin. Features of the Model of Main Information Failures in Digital CMOS VLSI at Impact of the Radiation. Joint Stock Company "Experimental Scientific and Production Association SPELS, 2018.
Warning: These citations may not always be 100% accurate.