Automation of an atomic force microscope via Arduino
The Atomic Force Microscopy is a very versatile technique that allows to characterize surfaces by acquiring topographies with sub-nanometer resolution. This technique often overcomes the problems and capabilities of electron microscopy when characterizing few nanometers thin coatings over solid subs...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2023-09-01
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| Series: | HardwareX |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2468067223000548 |