Automation of an atomic force microscope via Arduino

The Atomic Force Microscopy is a very versatile technique that allows to characterize surfaces by acquiring topographies with sub-nanometer resolution. This technique often overcomes the problems and capabilities of electron microscopy when characterizing few nanometers thin coatings over solid subs...

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Bibliographic Details
Main Authors: Jesus Gerardo Guerrero-Felix, Javier Lopez-Miras, Miguel Angel Rodriguez-Valverde, Carmen Lucia Moraila-Martinez, Miguel Angel Fernandez-Rodriguez
Format: Article
Language:English
Published: Elsevier 2023-09-01
Series:HardwareX
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2468067223000548

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