Automation of an atomic force microscope via Arduino
The Atomic Force Microscopy is a very versatile technique that allows to characterize surfaces by acquiring topographies with sub-nanometer resolution. This technique often overcomes the problems and capabilities of electron microscopy when characterizing few nanometers thin coatings over solid subs...
Main Authors: | Jesus Gerardo Guerrero-Felix, Javier Lopez-Miras, Miguel Angel Rodriguez-Valverde, Carmen Lucia Moraila-Martinez, Miguel Angel Fernandez-Rodriguez |
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Format: | Article |
Language: | English |
Published: |
Elsevier
2023-09-01
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Series: | HardwareX |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2468067223000548 |
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