A Ridge Penalized Likelihood Ratio Chart for Phase II Monitoring of High-Dimensional Process Dispersion Under Measurement System Inaccuracy

A Ridge Penalized Likelihood Ratio Chart for Phase II Monitoring of High-Dimensional Process Dispersion Under Measurement System Inaccuracy

In some applications, the number of quality characteristics is larger than the number of observations within subgroups. Common multivariate control charts to monitor the variability of such high-dimensional processes are unsuitable because the sample covariance matrix is not positive semi-definite a...

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Bibliographic Details
Main Authors: Ali Salmasnia, Mohammad Reza Maleki, Esmaeil Safikhani
Format: Article
Language:English
Published: Iran University of Science & Technology 2023-06-01
Series:International Journal of Industrial Engineering and Production Research
Subjects:
high-dimensional process
covariance matrix
measurement errors
ridge penalized likelihood ratio statistic
multiple measurements per item.
Online Access:http://ijiepr.iust.ac.ir/article-1-1501-en.pdf

Internet

http://ijiepr.iust.ac.ir/article-1-1501-en.pdf

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