Raman Identification of Polymorphs in Pentacene Films

Raman Identification of Polymorphs in Pentacene Films

We use Raman spectroscopy to characterize thin films of pentacene grown on Si/SiO x by Supersonic Molecular Beam Deposition (SuMBD). We find that films up to a thickness of about 781 Å (∼ 52 monolayers) all belong to the so-called thin-film (TF) phase. The appearance with strong intensity of...

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Bibliographic Details
Main Authors: Alberto Girlando, Matteo Masino, Aldo Brillante, Tullio Toccoli, Salvatore Iannotta
Format: Article
Language:English
Published: MDPI AG 2016-04-01
Series:Crystals
Subjects:
pentacene
polymorphism
raman spectroscopy
Online Access:http://www.mdpi.com/2073-4352/6/4/41

Internet

http://www.mdpi.com/2073-4352/6/4/41

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