Near-Field Imaging of Dielectric Components Using an Array of Microwave Sensors
Microwave imaging is a high-resolution, noninvasive, and noncontact method for detecting hidden defects, cracks, and objects with applications for testing nonmetallic components such as printed circuit boards, biomedical diagnosis, aerospace components inspection, etc. In this paper, an array of mic...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-03-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/12/6/1507 |