A clustering based dual model framework for EIT imaging: first experimental results

A clustering based dual model framework for EIT imaging: first experimental results

Electrical Impedance tomography (EIT) imaging suffers greatly from the illposedness of the corresponding inverse problem. This is mainly caused by the high degree of freedom and the relatively large noise. One attempt to circumvent these difficulties is to use dual models. This article introduces a...

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Bibliographic Details
Main Authors: Gong Bo, Schullcke Benjamin, Krueger-Ziolek Sabine, Moeller Knut
Format: Article
Language:English
Published: De Gruyter 2015-09-01
Series:Current Directions in Biomedical Engineering
Subjects:
k-means clustering
ill-posed
inverse problem
dual model
inite element method
eit
Online Access:https://doi.org/10.1515/cdbme-2015-0069

Internet

https://doi.org/10.1515/cdbme-2015-0069

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