Dielectric Response of ZnTe–Ti/Al Schottky Junctions with CdTe Quantum Dots Studied by Impedance Spectroscopy
The electrical properties of ZnTe−Ti/Al Schottky junctions were investigated by the impedance spectroscopy (IS) method. Current-voltage (<i>I</i><i>-</i><i>V</i>) and capacitance-voltage (<i>C</i><i>-</i><i>V</i>) meas...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-03-01
|
| Series: | Crystals |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2073-4352/10/3/170 |