Field Modeling of the Influence of Defects Caused by Bending of Conductive Textronic Layers on Their Electrical Conductivity
One of the critical parameters of thin-film electrically conductive structures in wearable electronics systems is their conductivity. In the process of using such structures, especially during bending, defects and microcracks appear that affect their electrical parameters. Understanding these phenom...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-01-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/23/3/1487 |