A new technique for quick identification of defective region inside γ-ray detector
The γ-ray detection efficiency of a detector decreases over time due to factors like radiation damage or an increase in the thickness of the inactive dead layer. For large γ-ray detector facilities, it is crucial to assess the health condition and performance of the inner regions of the detector cry...
| मुख्य लेखकों: | , , , , , , , |
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| स्वरूप: | लेख |
| भाषा: | English |
| प्रकाशित: |
EDP Sciences
2023-01-01
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| श्रृंखला: | EPJ Web of Conferences |
| विषय: | |
| ऑनलाइन पहुंच: | https://www.epj-conferences.org/articles/epjconf/pdf/2023/14/epjconf_animma2023_10003.pdf |