Probing Supercritical Accretion in Ultraluminous X-ray Source M82 X-1 by means of X-ray Spectral Evolution Analysis
We analyze the spectral evolution of ultraluminous X-ray source (ULX) M82 X-1 by means of spectral fitting. We use selected Swift/XRT data in 2014 and 2015. The flux of M82 X-1 increased by a factor of 2-3 from 2014 to 2015. Most of the data in 2015 show greater dominance of hard component than thos...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2020-01-01
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| Series: | EPJ Web of Conferences |
| Subjects: | |
| Online Access: | https://www.epj-conferences.org/articles/epjconf/pdf/2020/16/epjconf_seaan2020_07005.pdf |