Noise-Robust Online Measurement of the On-State Resistance of the Power Semiconductor Devices in PWM Converters
The increase in <inline-formula> <tex-math notation="LaTeX">${R} _{DUT}$ </tex-math></inline-formula>, the on-state resistance of power semiconductor devices, is used to estimate the remaining useful life (RUL) of the devices. Conventional online measurement of <...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2024-01-01
|
| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10518033/ |