Evaluation of thin film material properties using a deep nanoindentation and ANN
Due to the substrate effect, there are several difficulties to evaluate the material properties of thin films via nanoindentation. In this study, an inverse analysis method based on an artificial neural network (ANN) is proposed to obtain free-volume-model (FVM) parameters of thin film metallic glas...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2022-09-01
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| Series: | Materials & Design |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S0264127522006220 |