Metric-Based Semi-Supervised Regression
Regression problems are present in many industrial applications, and many supervised learning algorithms have been devised over decades. However, available labeled examples are limited in some application settings; meanwhile, enormous unlabeled examples are relatively easy to collect. Thus, this wor...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8979413/ |