Novel extraction method for contact resistance and effective mobility in carbon nanotube field-effect transistors using S-parameter measurements

Novel extraction method for contact resistance and effective mobility in carbon nanotube field-effect transistors using S-parameter measurements

In this paper, a novel method is presented for the accurate extraction of key parameters of carbon nanotube field-effect transistors (CNTFETs) using S-parameter measurements. An equivalent circuit model, which utilizes lumped components based on the physical characteristics of the device, is employe...

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Bibliographic Details
Main Authors: Yuming Zhang, Yang Yang, Tao Yang, Yong Zhang
Format: Article
Language:English
Published: Elsevier 2023-10-01
Series:Results in Physics
Subjects:
Carbon nanotube
CNTFET
Contact resistance
Channel capacitance
Mobility
S-parameter
Online Access:http://www.sciencedirect.com/science/article/pii/S2211379723007921

Internet

http://www.sciencedirect.com/science/article/pii/S2211379723007921

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