In Situ Coupling Applied Voltage and Synchrotron Radiation: Operando Characterization of Transistors

In Situ Coupling Applied Voltage and Synchrotron Radiation: Operando Characterization of Transistors

Abstract A compact voltage application setup has been developed for in situ electrical testing of organic field effect transistors in combination with X-ray scattering studies at a synchrotron beamlines. Challenges faced during real condition in-operando test of newly developed OFETs originated an i...

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Bibliographic Details
Main Authors: Anton Davydok, Yuriy N. Luponosov, Sergey A. Ponomarenko, Souren Grigorian
Format: Article
Language:English
Published: SpringerOpen 2022-02-01
Series:Nanoscale Research Letters
Subjects:
OFETs
Operando studies
nanoGIWAXS
nanoGIXD
α,ω-dihexyl-α-quaterthiophene
Online Access:https://doi.org/10.1186/s11671-022-03662-y

Internet

https://doi.org/10.1186/s11671-022-03662-y

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