Blockchain Assisted Data Edge Verification With Consensus Algorithm for Machine Learning Assisted IoT
Internet of Things (IoT) devices are becoming increasingly ubiquitous in daily life. They are utilized in various sectors like healthcare, manufacturing, and transportation. The main challenges related to IoT devices are the potential for faults to occur and their reliability. In classical IoT fault...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2023-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10138178/ |