WAVELET IDENTIFICATION OF 1/fPROCESS FOR THE FRACTAL DIMENSION OF MACHINED SURFACE TOPOGRAPHY

Combined with multi-scale analysis ability of wavelet, the wavelet identification of 1/f process is proposed for the characterization of machined surface topography, based on the fractal surface profile obtained by MB function, the fractal dimensions of different wavelet functions and different deco...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид: WEN ShuHua, ZHAO Yue, ZHANG XueLiang, CHEN YongHui, LAN GuoSheng
Формат: Өгүүллэг
Хэл сонгох:zho
Хэвлэсэн: Editorial Office of Journal of Mechanical Strength 2019-01-01
Цуврал:Jixie qiangdu
Нөхцлүүд:
Онлайн хандалт:http://www.jxqd.net.cn/thesisDetails#10.16579/j.issn.1001.9669.2019.04.003