X-ray Diffuse Scattering from Ca<sub>3</sub>NbGa<sub>3</sub>Si<sub>2</sub>O<sub>14</sub> Single Crystal under External Electric Field Application

X-ray diffuse scattering from the Ca<sub>3</sub>NbGa<sub>3</sub>Si<sub>2</sub>O<sub>14</sub> (CNGS) crystal was measured with a triple axis X-ray diffractometer under the conditions of an external electric field. It is found that the nature of the inte...

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Bibliographic Details
Main Authors: Dmitrii Irzhak, Dmitry Roshchupkin
Format: Article
Language:English
Published: MDPI AG 2022-11-01
Series:Materials
Subjects:
Online Access:https://www.mdpi.com/1996-1944/15/21/7692