A Microcrack Location Method Based on Nonlinear S0 Mode Lamb Wave and Probability Scan Positioning Imaging Matrix

Early damage, such as microcrack, occupies most of the fatigue life of materials, and timely detection of early damage and positioning has great engineering and economic value. In this paper, a matrix scanning and positioning imaging method based on a probabilistic algorithm is proposed. Cooperating...

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Bibliographic Details
Main Authors: Yibo Li, Shuo Zhang, Xiaobo Rui, Chang Ma, Zi Yang
Format: Article
Language:English
Published: MDPI AG 2019-05-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/9/9/1874