Atomic layer deposition to heterostructures for application in gas sensors

Atomic layer deposition (ALD) is a versatile technique to deposit metals and metal oxide sensing materials at the atomic scale to achieve improved sensor functions. This article reviews metals and metal oxide semiconductor (MOS) heterostructures for gas sensing applications in which at least one of...

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Bibliographic Details
Main Authors: Hongyin Pan, Lihao Zhou, Wei Zheng, Xianghong Liu, Jun Zhang, Nicola Pinna
Format: Article
Language:English
Published: IOP Publishing 2023-01-01
Series:International Journal of Extreme Manufacturing
Subjects:
Online Access:https://doi.org/10.1088/2631-7990/acc76d