Local Sensitivity Analysis and Monte Carlo Simulation to Examine the Effects of Chipless RFID Measurement Uncertainties—Part II: Consideration of Multiple Measurement Uncertainties
Measurement and response decoding is an ongoing challenge in the chipless radio-frequency identification (RFID) field. Measurement uncertainties, including tag/reader misalignment, S-parameter error, and clutter, can cause response distortions, such as magnitude changes and resonant frequency shifts...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2022-01-01
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| Series: | IEEE Open Journal of Instrumentation and Measurement |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9951061/ |