Metamodelling of Noise to Image Classification Performance

Machine Learning (ML) has made its way into a wide variety of advanced applications, where high accuracies can be achieved when these ML models are evaluated in the same context as they were trained and validated on. However, when these high-accuracy models are exposed to out-of-distribution points...

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Bibliographic Details
Main Authors: Jens De Hoog, Ali Anwar, Philippe Reiter, Siegfried Mercelis, Peter Hellinckx
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10117595/