Metamodelling of Noise to Image Classification Performance
Machine Learning (ML) has made its way into a wide variety of advanced applications, where high accuracies can be achieved when these ML models are evaluated in the same context as they were trained and validated on. However, when these high-accuracy models are exposed to out-of-distribution points...
Main Authors: | Jens De Hoog, Ali Anwar, Philippe Reiter, Siegfried Mercelis, Peter Hellinckx |
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Format: | Article |
Language: | English |
Published: |
IEEE
2023-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/10117595/ |
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