Influence of Hole Current Crowding on Snapback Breakdown in Multi-Finger MOSFETs
The snapback breakdown behavior of multi-finger MOSFETs was investigated using a device simulation. It is shown that snapback breakdown voltage (SNBV) varies depending on the source/drain configuration, even with the same two-finger structure. This results from the hole current crowding below the sh...
Main Authors: | Siyoun Lee, Seong-Yeon Kim, Haesoon Oh, Jaesung Sim, Woo Young Choi |
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Format: | Article |
Language: | English |
Published: |
IEEE
2023-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/10149319/ |
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