Root Electrical Capacitance Can Be a Promising Plant Phenotyping Parameter in Wheat
As root electrical capacitance (C<sub>R</sub>*) was assumed to depend on the stem properties, the efficiency of measuring C<sub>R</sub>* at flowering for whole-plant phenotyping was assessed in five wheat cultivars in three replicate plots over two years. Linear regression an...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-11-01
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| Series: | Plants |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2223-7747/11/21/2975 |