Delayered IC image analysis with template‐based Tanimoto Convolution and Morphological Decision

Delayered IC image analysis with template‐based Tanimoto Convolution and Morphological Decision

Abstract Supervised machine learning techniques are being pursued for delayered Integrated Circuit (IC) image analysis. However, repetitive data labelling and model training are required for every image set with the supervised techniques. In view of the large scale of IC image set being analysed, te...

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Bibliographic Details
Main Authors: Deruo Cheng, Yiqiong Shi, Tong Lin, Bah‐Hwee Gwee, Kar‐Ann Toh
Format: Article
Language:English
Published: Hindawi-IET 2022-03-01
Series:IET Circuits, Devices and Systems
Subjects:
image segmentation
deep learning (artificial intelligence)
convolutional neural nets
supervised learning
circuit analysis computing
integrated circuits
Online Access:https://doi.org/10.1049/cds2.12093

Internet

https://doi.org/10.1049/cds2.12093

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