Charge Distribution in Layered Lanthanide-Doped CuCr<sub>0.99</sub>Ln<sub>0.01</sub>S<sub>2</sub> (Ln = Pr–Tb) Thermoelectric Materials

Charge Distribution in Layered Lanthanide-Doped CuCr<sub>0.99</sub>Ln<sub>0.01</sub>S<sub>2</sub> (Ln = Pr–Tb) Thermoelectric Materials

The charge distribution study of metal atoms in CuCr<sub>0.99</sub>Ln<sub>0.01</sub>S<sub>2</sub> (Ln = Pr–Tb) solid solutions was carried out using X-ray photoelectron spectroscopy (XPS). The analysis of the binding energy of S2p, Cu2p, Cr2p, Ln3d and Ln4d levels...

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Bibliographic Details
Main Authors: Evgeniy V. Korotaev, Mikhail M. Syrokvashin, Irina Yu. Filatova, Aleksandr V. Sotnikov, Alexandr V. Kalinkin
Format: Article
Language:English
Published: MDPI AG 2022-12-01
Series:Materials
Subjects:
layered copper-chromium disulfide
XPS
lanthanides
Seebeck coefficient
thermoelectricity
Online Access:https://www.mdpi.com/1996-1944/15/24/8747

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https://www.mdpi.com/1996-1944/15/24/8747

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