Broadband Dielectric Characterization of High-Permittivity Rogers Substrates via Terahertz Time-Domain Spectroscopy in Reflection Mode

Broadband Dielectric Characterization of High-Permittivity Rogers Substrates via Terahertz Time-Domain Spectroscopy in Reflection Mode

We report the dielectric characterization of three commercially available, high-permittivity Rogers laminates in the sub-terahertz range, by means of terahertz time-domain spectroscopy measurements in reflection mode. A transmission-line model is developed to obtain the reflectance spectra as a func...

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Bibliographic Details
Main Authors: Walter Fuscaldo, Francesco Maita, Luca Maiolo, Romeo Beccherelli, Dimitrios C. Zografopoulos
Format: Article
Language:English
Published: MDPI AG 2022-08-01
Series:Applied Sciences
Subjects:
high-permittivity substrates
Rogers laminates
terahertz time-domain spectroscopy
dielectric material characterization
dielectric dispersion
Online Access:https://www.mdpi.com/2076-3417/12/16/8259

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https://www.mdpi.com/2076-3417/12/16/8259

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