Reliability analysis of computed tomography equipment using the q‐Weibull distribution

Abstract Inspired by the successful application of the q‐Weibull distribution in other research fields, we took the lead to use it in the field of medical devices in this work. The parameter estimation of the q‐Weibull distribution was performed using the probability plot method. The CT failure data...

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Bibliographic Details
Main Authors: Litian Fan, Zhi Hu, Qingqing Ling, Hanwei Li, Hongliang Qi, Hongwen Chen
Format: Article
Language:English
Published: Wiley 2023-07-01
Series:Engineering Reports
Subjects:
Online Access:https://doi.org/10.1002/eng2.12613