A Novel Line-Scan Algorithm for Unsynchronised Dynamic Measurements
In non-destructive inspections today, the size of the sample being examined is often limited to fit within the field of view of the camera being used. When examining larger specimens, multiple image sequences need to be stitched together into one image. Due to uneven illumination, the combined image...
| Main Authors: | , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-12-01
|
| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/14/1/235 |