Tracing Black Hole Signatures in Several Black Hole Candidates Based on Their X-Ray Spectral Evolution
Investigation of spectral evolution of four black hole candidates was carried out by using color-color diagram as well as spectral fitting on Swift/XRT data. Newly found candidates, which are classified as low-mass X-ray binary system based on their transient nature, are the focus of our work. We co...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2020-01-01
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| Series: | EPJ Web of Conferences |
| Subjects: | |
| Online Access: | https://www.epj-conferences.org/articles/epjconf/pdf/2020/16/epjconf_seaan2020_04001.pdf |