Deep Learning Regressors of Surface Properties from Atomic Force Microscopy Nanoindentations
Atomic force microscopy (AFM) is a powerful technique to study the nanomechanical properties of a wide range of materials at the piconewton level. AFM force–indentation curves can be fitted with appropriate contact models, enabling the determination of material properties for a given sample. However...
| Autores principales: | , , |
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| Formato: | Artículo |
| Lenguaje: | English |
| Publicado: |
MDPI AG
2024-03-01
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| Colección: | Applied Sciences |
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| Acceso en línea: | https://www.mdpi.com/2076-3417/14/6/2376 |