Deep Learning Regressors of Surface Properties from Atomic Force Microscopy Nanoindentations

Deep Learning Regressors of Surface Properties from Atomic Force Microscopy Nanoindentations

Atomic force microscopy (AFM) is a powerful technique to study the nanomechanical properties of a wide range of materials at the piconewton level. AFM force–indentation curves can be fitted with appropriate contact models, enabling the determination of material properties for a given sample. However...

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Bibliographic Details
Main Authors: Luís R. L. Pacheco, João P. S. Ferreira, Marco P. L. Parente
Format: Article
Language:English
Published: MDPI AG 2024-03-01
Series:Applied Sciences
Subjects:
artificial neural networks
contact mechanics
surface properties
nanoindentations
Online Access:https://www.mdpi.com/2076-3417/14/6/2376

Internet

https://www.mdpi.com/2076-3417/14/6/2376

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