Surface Passivation by Quantum Exclusion: On the Quantum Efficiency and Stability of Delta-Doped CCDs and CMOS Image Sensors in Space

Surface Passivation by Quantum Exclusion: On the Quantum Efficiency and Stability of Delta-Doped CCDs and CMOS Image Sensors in Space

Radiation-induced damage and instabilities in back-illuminated silicon detectors have proved to be challenging in multiple NASA and commercial applications. In this paper, we develop a model of detector quantum efficiency (QE) as a function of Si–SiO<sub>2</sub> interface and oxide trap...

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Bibliographic Details
Main Authors: Michael E. Hoenk, April D. Jewell, Gillian Kyne, John Hennessy, Todd Jones, Charles Shapiro, Nathan Bush, Shouleh Nikzad, David Morris, Katherine Lawrie, Jesper Skottfelt
Format: Article
Language:English
Published: MDPI AG 2023-12-01
Series:Sensors
Subjects:
CMOS image sensors
delta-doped CCD
radiation damage
stability
image sensor
delta-doped silicon
Online Access:https://www.mdpi.com/1424-8220/23/24/9857

Internet

https://www.mdpi.com/1424-8220/23/24/9857

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