Decoding Material Structures with Scanning Electron Diffraction Techniques

Recent advancements in electron detectors and computing power have revolutionized the rapid recording of millions of 2D diffraction patterns across a grid of probe positions, known as four-dimensional scanning transmission electron microscopy (4D-STEM). These datasets serve as the foundation for inn...

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Bibliographic Details
Main Author: Sangmoon Yoon
Format: Article
Language:English
Published: MDPI AG 2024-03-01
Series:Crystals
Subjects:
Online Access:https://www.mdpi.com/2073-4352/14/3/275