Decoding Material Structures with Scanning Electron Diffraction Techniques
Recent advancements in electron detectors and computing power have revolutionized the rapid recording of millions of 2D diffraction patterns across a grid of probe positions, known as four-dimensional scanning transmission electron microscopy (4D-STEM). These datasets serve as the foundation for inn...
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Format: | Article |
Language: | English |
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MDPI AG
2024-03-01
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Series: | Crystals |
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Online Access: | https://www.mdpi.com/2073-4352/14/3/275 |