Testing the Accuracy of the Calculation of Gold Leaf Thickness by MC Simulations and MA-XRF Scanning
The use of X-ray fluorescence (XRF) scanning systems has become a common practice in many application sectors. In multistratified and heterogeneous samples, the simple analysis of an XRF spectrum as a response of the entire sample is not reliable, so different spectral analysis techniques have been...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-05-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/10/10/3582 |