Defect Detection for Metal Base of TO-Can Packaged Laser Diode Based on Improved YOLO Algorithm
Defect detection is an important part of the manufacturing process of mechanical products. In order to detect the appearance defects quickly and accurately, a method of defect detection for the metal base of TO-can packaged laser diode (metal TO-base) based on the improved You Only Look Once (YOLO)...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-05-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/11/10/1561 |