Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern
Particle counting is of critical importance for nanotechnology, environmental monitoring, pharmaceutical, food and semiconductor industries. Here we introduce a super-resolution single-shot optical method for counting and mapping positions of subwavelength particles on a surface. The method is based...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
De Gruyter
2023-01-01
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| Series: | Nanophotonics |
| Subjects: | |
| Online Access: | https://doi.org/10.1515/nanoph-2022-0612 |