Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern
Particle counting is of critical importance for nanotechnology, environmental monitoring, pharmaceutical, food and semiconductor industries. Here we introduce a super-resolution single-shot optical method for counting and mapping positions of subwavelength particles on a surface. The method is based...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
De Gruyter
2023-01-01
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| Series: | Nanophotonics |
| Subjects: | |
| Online Access: | https://doi.org/10.1515/nanoph-2022-0612 |
| _version_ | 1826963994116620288 |
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| author | Chan Eng Aik Rendón-Barraza Carolina Wang Benquan Pu Tanchao Ou Jun-Yu Wei Hongxin Adamo Giorgio An Bo Zheludev Nikolay I. |
| author_facet | Chan Eng Aik Rendón-Barraza Carolina Wang Benquan Pu Tanchao Ou Jun-Yu Wei Hongxin Adamo Giorgio An Bo Zheludev Nikolay I. |
| author_sort | Chan Eng Aik |
| collection | DOAJ |
| description | Particle counting is of critical importance for nanotechnology, environmental monitoring, pharmaceutical, food and semiconductor industries. Here we introduce a super-resolution single-shot optical method for counting and mapping positions of subwavelength particles on a surface. The method is based on the deep learning analysis of the intensity profile of the coherent light scattered on the group of particles. In a proof of principle experiment, we demonstrated particle counting accuracies of more than 90%. We also demonstrate that the particle locations can be mapped on a 4 × 4 grid with a nearly perfect accuracy (16-pixel binary imaging of the particle ensemble). Both the retrieval of number of particles and their mapping is achieved with super-resolution: accuracies are similar for sets with closely located optically unresolvable particles and sets with sparsely located particles. As the method does not require fluorescent labelling of the particles, is resilient to small variations of particle sizes, can be adopted to counting various types of nanoparticulates and high rates, it can find applications in numerous particles counting tasks in nanotechnology, life sciences and beyond. |
| first_indexed | 2024-03-12T17:04:28Z |
| format | Article |
| id | doaj.art-e55115a0c49a45d7b5bf5f31001bede8 |
| institution | Directory Open Access Journal |
| issn | 2192-8606 2192-8614 |
| language | English |
| last_indexed | 2025-02-18T02:48:57Z |
| publishDate | 2023-01-01 |
| publisher | De Gruyter |
| record_format | Article |
| series | Nanophotonics |
| spelling | doaj.art-e55115a0c49a45d7b5bf5f31001bede82024-11-25T11:19:09ZengDe GruyterNanophotonics2192-86062192-86142023-01-0112142807281210.1515/nanoph-2022-0612Counting and mapping of subwavelength nanoparticles from a single shot scattering patternChan Eng Aik0Rendón-Barraza Carolina1Wang Benquan2Pu Tanchao3Ou Jun-Yu4Wei Hongxin5Adamo Giorgio6An Bo7Zheludev Nikolay I.8Centre for Disruptive Photonic Technologies, The Photonics Institute, School of Physical and Mathematical Sciences, Nanyang Technological University, 637371Singapore, SingaporeCentre for Disruptive Photonic Technologies, The Photonics Institute, School of Physical and Mathematical Sciences, Nanyang Technological University, 637371Singapore, SingaporeCentre for Disruptive Photonic Technologies, The Photonics Institute, School of Physical and Mathematical Sciences, Nanyang Technological University, 637371Singapore, SingaporeCentre for Photonic Metamaterials and Optoelectronics Research Centre, University of Southampton, SouthamptonSO17 1BJ, UKCentre for Photonic Metamaterials and Optoelectronics Research Centre, University of Southampton, SouthamptonSO17 1BJ, UKSchool of Computer Science and Engineering, Nanyang Technological University, 639798Singapore, SingaporeCentre for Disruptive Photonic Technologies, The Photonics Institute, School of Physical and Mathematical Sciences, Nanyang Technological University, 637371Singapore, SingaporeSchool of Computer Science and Engineering, Nanyang Technological University, 639798Singapore, SingaporeCentre for Disruptive Photonic Technologies, The Photonics Institute, School of Physical and Mathematical Sciences, Nanyang Technological University, 637371Singapore, SingaporeParticle counting is of critical importance for nanotechnology, environmental monitoring, pharmaceutical, food and semiconductor industries. Here we introduce a super-resolution single-shot optical method for counting and mapping positions of subwavelength particles on a surface. The method is based on the deep learning analysis of the intensity profile of the coherent light scattered on the group of particles. In a proof of principle experiment, we demonstrated particle counting accuracies of more than 90%. We also demonstrate that the particle locations can be mapped on a 4 × 4 grid with a nearly perfect accuracy (16-pixel binary imaging of the particle ensemble). Both the retrieval of number of particles and their mapping is achieved with super-resolution: accuracies are similar for sets with closely located optically unresolvable particles and sets with sparsely located particles. As the method does not require fluorescent labelling of the particles, is resilient to small variations of particle sizes, can be adopted to counting various types of nanoparticulates and high rates, it can find applications in numerous particles counting tasks in nanotechnology, life sciences and beyond.https://doi.org/10.1515/nanoph-2022-0612nanoparticle countingnanoparticle imagingsub-rayleigh counting |
| spellingShingle | Chan Eng Aik Rendón-Barraza Carolina Wang Benquan Pu Tanchao Ou Jun-Yu Wei Hongxin Adamo Giorgio An Bo Zheludev Nikolay I. Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern Nanophotonics nanoparticle counting nanoparticle imaging sub-rayleigh counting |
| title | Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern |
| title_full | Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern |
| title_fullStr | Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern |
| title_full_unstemmed | Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern |
| title_short | Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern |
| title_sort | counting and mapping of subwavelength nanoparticles from a single shot scattering pattern |
| topic | nanoparticle counting nanoparticle imaging sub-rayleigh counting |
| url | https://doi.org/10.1515/nanoph-2022-0612 |
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