Characterization and Mapping of Spot Blotch in Triticum durum–Aegilops speltoides Introgression Lines Using SNP Markers

Characterization and Mapping of Spot Blotch in Triticum durum–Aegilops speltoides Introgression Lines Using SNP Markers

Spot blotch (SB) of wheat is emerging as a major threat to successful wheat production in warm and humid areas of the world. SB, also called leaf blight, is caused by Bipolaris sorokiniana, and is responsible for high yield losses in Eastern Gangetic Plains Zone in India. More recently, SB is extend...

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Bibliographic Details
Main Authors: Jashanpreet Kaur, Jaspal Kaur, Guriqbal Singh Dhillon, Harmandeep Kaur, Jasvir Singh, Ritu Bala, Puja Srivastava, Satinder Kaur, Achla Sharma, Parveen Chhuneja
Format: Article
Language:English
Published: Frontiers Media S.A. 2021-05-01
Series:Frontiers in Plant Science
Subjects:
leaf blight
spot blotch
backcross introgression lines
Aegilops speltoides
Bipolaris sorokiniana
Triticum durum
Online Access:https://www.frontiersin.org/articles/10.3389/fpls.2021.650400/full

Internet

https://www.frontiersin.org/articles/10.3389/fpls.2021.650400/full

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