Neural network technology for identifying defect sizes in half-plane based on time and positional scanning

Introduction. The selected research topic urgency is due to the need for a quick assessment of the condition and reliability of materials used in various designs. The work objective was to study parameters of the influence of the defect on the response of the surface of the medium to the shock effec...

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Bibliographic Details
Main Authors: A. N. Solov'ev, A. V. Cherpakov, P. V. Vasil’ev, I. A. Parinov, E. V. Kirillova
Format: Article
Language:Russian
Published: Don State Technical University 2020-10-01
Series:Advanced Engineering Research
Subjects:
Online Access:https://www.vestnik-donstu.ru/jour/article/view/1685