Reconciling measured scattering response of 3D metamaterials with simulation
Membrane projection lithography is used to create 3-dimensional unit cells in a silicon matrix decorated with metallic inclusions. The structures show pronounced resonances in the 4–16 µm wavelength range and demonstrate direct coupling to the magnetic field of a normally incident transverse electro...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2015-01-01
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| Series: | EPJ Applied Metamaterials |
| Subjects: | |
| Online Access: | http://dx.doi.org/10.1051/epjam/2015015 |