Effect of AlN on the microstructure evolution of Cu/Sn58Bi/Cu solder joints for 3D packaging at different bonding times

Cu/Sn58Bi/Cu and Cu/Sn58Bi-0.05AlN/Cu were prepared by transient liquid-phase bonding (TLP) bonding process for low temperature bonding and high temperature service. The evolution of interfacial IMC and the influence mechanism of AlN on TLP solder joints were studied. During the bonding process, the...

Full description

Bibliographic Details
Main Authors: Xi Wang, Liang Zhang, Chen Chen, Xiao Lu
Format: Article
Language:English
Published: Elsevier 2023-07-01
Series:Journal of Materials Research and Technology
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2238785423014941
_version_ 1797745225444098048
author Xi Wang
Liang Zhang
Chen Chen
Xiao Lu
author_facet Xi Wang
Liang Zhang
Chen Chen
Xiao Lu
author_sort Xi Wang
collection DOAJ
description Cu/Sn58Bi/Cu and Cu/Sn58Bi-0.05AlN/Cu were prepared by transient liquid-phase bonding (TLP) bonding process for low temperature bonding and high temperature service. The evolution of interfacial IMC and the influence mechanism of AlN on TLP solder joints were studied. During the bonding process, the top and bottom IMC show asymmetric growth. With the increase of bonding time, Cu6Sn5 and Cu3Sn in the two solder joints continue to grow, and finally complete IMC morphology can be formed, of which Cu6Sn5 IMC is more and Cu3Sn IMC is less. In addition, by calculating the growth rate of Cu3Sn IMC, it was found that the growth rate of Cu3Sn IMC at both ends of the three-dimensional solder joint containing AlN is suppressed.
first_indexed 2024-03-12T15:20:20Z
format Article
id doaj.art-e69eb9f56661403bb1e7363770e0d264
institution Directory Open Access Journal
issn 2238-7854
language English
last_indexed 2024-03-12T15:20:20Z
publishDate 2023-07-01
publisher Elsevier
record_format Article
series Journal of Materials Research and Technology
spelling doaj.art-e69eb9f56661403bb1e7363770e0d2642023-08-11T05:34:03ZengElsevierJournal of Materials Research and Technology2238-78542023-07-012544884496Effect of AlN on the microstructure evolution of Cu/Sn58Bi/Cu solder joints for 3D packaging at different bonding timesXi Wang0Liang Zhang1Chen Chen2Xiao Lu3School of Materials Science and Engineering, Xiamen University of Technology, Xiamen 361024, China; School of Mechatronic Engineering, Jiangsu Normal University, Xuzhou 221116, ChinaSchool of Materials Science and Engineering, Xiamen University of Technology, Xiamen 361024, China; Corresponding author.School of Mechatronic Engineering, Jiangsu Normal University, Xuzhou 221116, ChinaSchool of Mechatronic Engineering, Jiangsu Normal University, Xuzhou 221116, ChinaCu/Sn58Bi/Cu and Cu/Sn58Bi-0.05AlN/Cu were prepared by transient liquid-phase bonding (TLP) bonding process for low temperature bonding and high temperature service. The evolution of interfacial IMC and the influence mechanism of AlN on TLP solder joints were studied. During the bonding process, the top and bottom IMC show asymmetric growth. With the increase of bonding time, Cu6Sn5 and Cu3Sn in the two solder joints continue to grow, and finally complete IMC morphology can be formed, of which Cu6Sn5 IMC is more and Cu3Sn IMC is less. In addition, by calculating the growth rate of Cu3Sn IMC, it was found that the growth rate of Cu3Sn IMC at both ends of the three-dimensional solder joint containing AlN is suppressed.http://www.sciencedirect.com/science/article/pii/S2238785423014941TLPSn58BiSolder jointAlN nanoparticles
spellingShingle Xi Wang
Liang Zhang
Chen Chen
Xiao Lu
Effect of AlN on the microstructure evolution of Cu/Sn58Bi/Cu solder joints for 3D packaging at different bonding times
Journal of Materials Research and Technology
TLP
Sn58Bi
Solder joint
AlN nanoparticles
title Effect of AlN on the microstructure evolution of Cu/Sn58Bi/Cu solder joints for 3D packaging at different bonding times
title_full Effect of AlN on the microstructure evolution of Cu/Sn58Bi/Cu solder joints for 3D packaging at different bonding times
title_fullStr Effect of AlN on the microstructure evolution of Cu/Sn58Bi/Cu solder joints for 3D packaging at different bonding times
title_full_unstemmed Effect of AlN on the microstructure evolution of Cu/Sn58Bi/Cu solder joints for 3D packaging at different bonding times
title_short Effect of AlN on the microstructure evolution of Cu/Sn58Bi/Cu solder joints for 3D packaging at different bonding times
title_sort effect of aln on the microstructure evolution of cu sn58bi cu solder joints for 3d packaging at different bonding times
topic TLP
Sn58Bi
Solder joint
AlN nanoparticles
url http://www.sciencedirect.com/science/article/pii/S2238785423014941
work_keys_str_mv AT xiwang effectofalnonthemicrostructureevolutionofcusn58bicusolderjointsfor3dpackagingatdifferentbondingtimes
AT liangzhang effectofalnonthemicrostructureevolutionofcusn58bicusolderjointsfor3dpackagingatdifferentbondingtimes
AT chenchen effectofalnonthemicrostructureevolutionofcusn58bicusolderjointsfor3dpackagingatdifferentbondingtimes
AT xiaolu effectofalnonthemicrostructureevolutionofcusn58bicusolderjointsfor3dpackagingatdifferentbondingtimes